Vertical two-zone thermal shock test chamber
Sanwood two-zone thermal shock test chamber is the most suitable test chamber for testing IC chips and small electronic devices. This chamber is designed with two independent control rooms, one for low temperature and one for high temperature.
The two-zone vertical thermal shock test chamber simulates the extreme thermal shock that a product may experience during actual use. The thermal shock chamber helps R&D and quality control teams evaluate product reliability and performance under harsh conditions.